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課程名稱 |
X光繞射學
X-ray Diffraction |
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開課學期 |
108-2 |
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授課對象 |
工學院 分子科學與技術國際研究生博士學位學程 |
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授課教師 |
溫政彥 |
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課號 |
MSE7007 |
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課程識別碼 |
527EM1030 |
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班次 |
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學分 |
3.0 |
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全/半年 |
半年 |
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必/選修 |
選修 |
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上課時間 |
星期五2,3,4(9:10~12:10) |
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上課地點 |
綜602 |
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備註 |
本課程以英語授課。
總人數上限：50人
外系人數限制：5人 |
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Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1082MSE7007_ |
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課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
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課程大綱
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課程概述 |
X-ray and electron diffraction methods are very useful for material researches. Various techniques have been developed for studying crystal structures, identifying and quantifying phases, determining crystal orientations and obtaining many other structural properties of materials. In this course, we will first introduce basic crystallography of materials and then discuss the fundamental concepts of diffraction, principle of diffraction, and the mathematical methods to solve the diffraction problems. Diffraction methods, practical considerations, and examples will be discussed in the lectures. |
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課程目標 |
In this course, students will learn:
1. Basic crystallography of materials.
2. Properties of X-rays.
3. Principle of diffractions.
4. Concepts of the reciprocal lattice.
5. The Ewald construction.
6. Mathematical tools for simplifying diffraction problems - Fourier transform and the convolution theory.
7. Diffraction methods.
8. Crystal structure analysis. |
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課程要求 |
待補 |
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預期每週課後學習時數 |
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Office Hours |
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指定閱讀 |
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參考書目 |
B. D. Cullity and S. R. Stack, Elements of X-ray Diffraction, 3rd Ed., Prentice Hall, 2001.
A. D. Krawitz, Introduction to Diffraction in Materials Science and Engineering, John
Wiley & Sons, 2001.
B. E. Warren, X-ray Diffraction, Dover, 1992.
A. Guinier, X-ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies, Dover, 1994.
C. Barrett and T. B. Massalski, Structure of Metals, Pergamon, 1982.
D. S. Siva, Elementary Scattering Theory, Oxford, 2011. |
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評量方式
(僅供參考) |
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週次 |
日期 |
單元主題 |
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Week 1 |
3/06 |
Lattice structure |
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Week 2 |
3/13 |
Reciprocal lattice |
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Week 3 |
3/20 |
Fourier transform |
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Week 4 |
3/27 |
Convolution theorem, plane waves and wave equations |
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Week 5 |
4/03 |
Holiday |
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Week 6 |
4/10 |
Principle of diffraction, Laue equations, Ewald construction |
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Week 7 |
4/17 |
Diffraction methods |
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Week 8 |
4/24 |
Diffraction methods (II) and diffraction intensity |
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Week 9 |
5/01 |
Midterm exam |
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Week 10 |
5/08 |
Diffraction intensity, Interference function, Scherrer equation |
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Week 11 |
5/15 |
Integrated intensity |
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Week 12 |
5/22 |
Temperature factor, absorption factor, GIXRD |
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Week 13 |
5/29 |
Film thickness measurement, interference function of gases and amorphous phase, ordering parameter, anti-phase domain structure |
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Week 14 |
6/05 |
Quantitative analysis, space group and crystal structure analysis |
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Week 15 |
6/12 |
Demo |
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